Substrated resistance modeling by combination of BEM and FEM methodologies
Book Chapter
(2004)
Author(s)
E. Schrik (TU Delft - Signal Processing Systems)
Nick van der Meijs (TU Delft - Signal Processing Systems)
Research Group
Signal Processing Systems
To reference this document use:
https://resolver.tudelft.nl/uuid:6795cdce-ba5a-4265-ad29-44f160bb3b44
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Publication Year
2004
Research Group
Signal Processing Systems
Pages (from-to)
364-372
ISBN (print)
3-540-21372-4
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