The influence of stacking faults on the leakage current of b-layer p+n diodes

Conference Paper (2010)
Author(s)

Negin Golshani (TU Delft - Electronic Components, Technology and Materials)

Wiebe de Boer (TU Delft - Electronic Components, Technology and Materials)

TLM Scholtes (TU Delft - Electronic Components, Technology and Materials)

A. Sakic (TU Delft - Electronic Components, Technology and Materials)

LK Nanver (TU Delft - Electronic Components, Technology and Materials)

Research Group
Electronic Components, Technology and Materials
More Info
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Publication Year
2010
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
81-84

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