The influence of stacking faults on the leakage current of b-layer p+n diodes
Conference Paper
(2010)
Author(s)
N. Golshani (TU Delft - Electronic Components, Technology and Materials)
WB de Boer (TU Delft - Electronic Components, Technology and Materials)
T.L.M. Scholtes (TU Delft - Electronic Components, Technology and Materials)
A Sakic (TU Delft - Electronic Components, Technology and Materials)
L. K. Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:6929afbd-d933-4fb5-ae32-1709b5969d66
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Publication Year
2010
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
81-84
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