Electrical transport mechanisms in amorphous/crystalline silicon heterojunction: Impact of passivation layer thickness

Mikolášek, M; Nemec, M; Vojs, M; Jakaboviča, V; Řeháček, V; Zhang, D.; Zeman, Miro; Harmatha, L

Electrical transport mechanisms in amorphous/crystalline silicon heterojunction: Impact of passivation layer thickness

Journal article (2014)

Authors

M Mikolášek External organisation

M Nemec External organisation

M Vojs External organisation

V Jakaboviča External organisation

V Řeháček External organisation

D. Zhang Electronic Components, Technology and Materials

Miro Zeman Photovoltaic Materials and Devices

L Harmatha External organisation

Research Group

Electronic Components, Technology and Materials

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Published Date

2014

Language

English

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Research Group

Electronic Components, Technology and Materials

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