Unveiling Hidden Anomalies
A Hybrid Approach for Surface Mounted Electronics
Amir Ghorbani Ghezeljehmeidan (TU Delft - Electronic Components, Technology and Materials)
Williem van Driel (TU Delft - Electronic Components, Technology and Materials)
Justin Dauwels (TU Delft - Signal Processing Systems)
More Info
expand_more
Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.
Abstract
Industrial assembly lines are the heartbeat of modern manufacturing, where precision and efficiency are paramount. This paper introduces a novel hybrid Explainable artificial intelligence (XAI) approach to enhance monitoring and analysis in industrial assembly. By fusing the power of vision anomaly detection models with the clarity of the gradient tree boosting algorithm, this framework not only boosts defect detection accuracy but also provides transparent, actionable insights. This synergy transforms how operators and engineers interact with AI, fostering trust and enhancing operational excellence.