A CMOS Dual-RC frequency reference with ±250ppm inaccuracy from -45°C to 85°C

Conference paper (2018)

Authors

C. Gürleyük Electronic Instrumentation - EEMCS
L. Pedala' Electronic Instrumentation - EEMCS
F. Sebastiano (OLD)Applied Quantum Architectures
K.A.A. Makinwa Microelectronics
Research Group
Electronic Instrumentation (EEMCS) (TU Delft)
Copyright: © 2018 C. Gürleyük, L. Pedala', F. Sebastiano, K.A.A. Makinwa
DOI: https://doi.org/10.1109/ISSCC.2018.8310180
Thermal stability Jitter Temperature measurement Resistors Frequency locked loops Circuit stability Oscillators
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Published Date

2018

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Instrumentation

Abstract

To comply with wired communication standards such as USB, SATA and PCI/PCI-E, systems-on-chip require frequency references with better than 300ppm accuracy. LC-based references achieve 100ppm accuracy [1], but suffer from high power consumption (∼20mW). Thermal diffusivity (TD) references require less power (∼2mW), at the expense of less accuracy (1000ppm) [2]. RC-based references offer the lowest power consumption, but their accuracy is typically limited to ∼0.1% [3]. In RC relaxation oscillators, comparator offset and delay are the major sources of inaccuracy [4,5]. References based on frequency-locked loops (FLLs) circumvent these by locking an oscillator's frequency to the time-constant of an RC filter, but their accuracy is then limited by the nonlinear temperature dependency of on-chip resistors [3,6].