A CMOS Dual-RC frequency reference with ±250ppm inaccuracy from -45°C to 85°C

Conference Paper (2018)
Author(s)

Çağri Gürleyük (TU Delft - Electronic Instrumentation)

Lorenzo Pedalà (TU Delft - Electronic Instrumentation)

Fabio Sebastiano (TU Delft - (OLD)Applied Quantum Architectures)

Kofi A.A. Makinwa (TU Delft - Microelectronics)

Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.1109/ISSCC.2018.8310180
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Publication Year
2018
Language
English
Research Group
Electronic Instrumentation
Volume number
61
Pages (from-to)
54-56
ISBN (print)
978-1-5386-2227-8
ISBN (electronic)
978-1-5090-4940-0
Event
65th IEEE International Solid-State Circuits Conference, ISSCC 2018 (2018-02-11 - 2018-02-15), San Francisco, United States
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Abstract

To comply with wired communication standards such as USB, SATA and PCI/PCI-E, systems-on-chip require frequency references with better than 300ppm accuracy. LC-based references achieve 100ppm accuracy [1], but suffer from high power consumption (∼20mW). Thermal diffusivity (TD) references require less power (∼2mW), at the expense of less accuracy (1000ppm) [2]. RC-based references offer the lowest power consumption, but their accuracy is typically limited to ∼0.1% [3]. In RC relaxation oscillators, comparator offset and delay are the major sources of inaccuracy [4,5]. References based on frequency-locked loops (FLLs) circumvent these by locking an oscillator's frequency to the time-constant of an RC filter, but their accuracy is then limited by the nonlinear temperature dependency of on-chip resistors [3,6].

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