Characterization of single-crystalline Al films grown on Si(111)
Journal Article
(1996)
Author(s)
AW Fortuin (TU Delft - QN/Fysics of NanoElectronics)
Paul Alkemade (TU Delft - Old - sect Electronic Materials (NS/EM))
AH Verbruggen (TU Delft - QN/Fysics of NanoElectronics)
AJ Steinfort (TU Delft - Old organisation TN/TechnischeNatuurkunde voorm)
H. W. Zandbergen (TU Delft - OLD Virtual Materials and Mechanics)
S Radelaar (TU Delft - OLD Metals Processing, Microstructures and Properties)
Research Group
QN/Fysics of NanoElectronics
To reference this document use:
https://resolver.tudelft.nl/uuid:6eeacf10-59a1-4fe2-be18-31e0be874422
More Info
expand_more
expand_more
Publication Year
1996
Research Group
QN/Fysics of NanoElectronics
Volume number
366
Pages (from-to)
285-294
No files available
Metadata only record. There are no files for this record.