Prediction and verification of process induced warpage of electronic packages
Journal Article
(2003)
Author(s)
WD van Driel (External organisation)
GQ Zhang (External organisation)
JHJ Janssen (External organisation)
LJ Ernst (TU Delft - Dynamics of Micro and Nano Systems)
F Su (External organisation)
KS Chian (External organisation)
S Yi (External organisation)
Research Group
Dynamics of Micro and Nano Systems
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Publication Year
2003
Research Group
Dynamics of Micro and Nano Systems
Volume number
43
Pages (from-to)
765-774
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