March tests for realistic faults in two-port memories
Conference Paper
(2000)
Author(s)
Said Hamdioui (TU Delft - Computer Engineering)
AJ van de Goor Ph D (External organisation)
Research Group
Computer Engineering
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https://resolver.tudelft.nl/uuid:739a9b9d-109c-41ad-97e5-33cc6461b920
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Publication Year
2000
Research Group
Computer Engineering
Pages (from-to)
73-78
ISBN (print)
0-7695-0689-5
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