Low-Depth Flag-Style Syndrome Extraction for Small Quantum Error-Correction Codes

Conference Paper (2023)
Author(s)

Dhruv Bhatnagar (Student TU Delft)

Matthew Steinberg (TU Delft - QCD/Feld Group)

David Elkouss (OIST Graduate University)

Carmen Almudever (Technical University of Valencia)

Sebastian Feld (TU Delft - Quantum Circuit Architectures and Technology)

Research Group
QCD/Feld Group
DOI related publication
https://doi.org/10.1109/QCE57702.2023.00016
More Info
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Publication Year
2023
Language
English
Research Group
QCD/Feld Group
Pages (from-to)
63-69
ISBN (print)
979-8-3503-4324-3
ISBN (electronic)
979-8-3503-4323-6
Event
2023 IEEE International Conference on Quantum Computing and Engineering (QCE) (2023-09-17 - 2023-09-22), Bellevue, United States
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Abstract

Flag-style fault-tolerance has become a linchpin in the realization of small fault-tolerant quantum-error correction experiments. The flag protocol's utility hinges on low qubit over-head, which is typically much smaller than in other approaches. However, as in most fault-tolerance protocols, the advantages of flag-style error correction come with a tradeoff: fault tolerance can be guaranteed, but such protocols involve high-depth circuits, due to the need for repeated stabilizer measurements. Here, we demonstrate that a dynamic choice of stabilizer measurements, based on past syndromes, and the utilization of elements from the full stabilizer group, leads to flag protocols with lower-depth syndrome-extraction circuits for the [[5], [1], [3]] code, as well as for the Steane code when compared to the standard methods in flag fault tolerance. We methodically prove that our new protocols yield fault-tolerant lookup tables, and demonstrate them with a pseudothreshold simulation, showcasing large improvements for all protocols when compared to previously-established methods. This work opens the dialogue on exploiting the properties of the full stabilizer group for reducing circuit overhead in fault-tolerant quantum-error correction.