Prediction of interfacial delamination in stacked IC structures using combined experimental and simulation methods
Conference Paper
(2003)
Author(s)
C. Liu (TU Delft - Dynamics of Micro and Nano Systems)
GQ Zhang (External organisation)
WD van Driel (External organisation)
RBR van Silfhout (External organisation)
MAJ van Gils (External organisation)
L.J. Ernst (TU Delft - Dynamics of Micro and Nano Systems)
Research Group
Dynamics of Micro and Nano Systems
To reference this document use:
https://resolver.tudelft.nl/uuid:79443a4f-ac2d-4333-80ef-3a8e27ff049f
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Publication Year
2003
Research Group
Dynamics of Micro and Nano Systems
Pages (from-to)
337-343
ISBN (print)
0-7803-7054-6
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