On the effect of cure-residual stress on flip chip failure prediction
Conference Paper
(2002)
Author(s)
L.J. Ernst (TU Delft - Dynamics of Micro and Nano Systems)
D Yang (TU Delft - Dynamics of Micro and Nano Systems)
Kaspar M.B. Jansen (TU Delft - Dynamics of Micro and Nano Systems)
C van t Hof (TU Delft - Dynamics of Micro and Nano Systems)
GQ Zhang (External organisation)
WD van Driel (External organisation)
Research Group
Dynamics of Micro and Nano Systems
To reference this document use:
https://resolver.tudelft.nl/uuid:796b5bb6-f810-4186-820a-928a4307804f
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Publication Year
2002
Research Group
Dynamics of Micro and Nano Systems
Pages (from-to)
398-403
ISBN (print)
0-7803-7435-5
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