Defect re-distribution in amorphous silicon below equilibration temperature
Journal Article
(2000)
Author(s)
R A C M M van van Swaaij (TU Delft - Electronic Components, Technology and Materials)
V Nádazdy (External organisation)
Miro Zeman (TU Delft - Electronic Components, Technology and Materials)
E Pincik (External organisation)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:7a1441d4-cef1-4d28-b3a4-065e0ede21a0
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Publication Year
2000
Research Group
Electronic Components, Technology and Materials
Issue number
266-269
Pages (from-to)
553-557
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