Surface-charge-collection-enhanced high-sensitivity high-stability silicon photodiodes for DUV and VUV spectral ranges
Journal Article
(2012)
Author(s)
L Shi (TU Delft - Electronic Instrumentation)
S Nihtianov (TU Delft - Electronic Instrumentation)
L Haspeslagh (External organisation)
F Scholze (External organisation)
Lukas M. Gottwald (External organisation)
L.K. Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.1109/TED.2012.2210225
To reference this document use:
https://resolver.tudelft.nl/uuid:7d436e25-c2a2-4b51-8efa-f62784195931
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Publication Year
2012
Language
English
Research Group
Electronic Instrumentation
Issue number
11
Volume number
59
Pages (from-to)
2888-2894
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