The effect of switched biasing on 1/f noise in CMOS imager front-ends
Conference Paper
(2005)
Author(s)
MF Snoeij (TU Delft - Electronic Instrumentation)
A.J.P.A.M. Theuwissen (TU Delft - Electronic Instrumentation)
JH Huijsing (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
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https://resolver.tudelft.nl/uuid:7fce4537-c0f2-429f-a322-e32c5ac58693
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Publication Year
2005
Research Group
Electronic Instrumentation
Bibliographical Note
Editor onbekend, WPM@en
Pages (from-to)
68-71
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