Hydrogen storage in Mg2FeSi alloy thin films depending on the Fe-to-Si ratio measured by conversion electron Mössbauer spectroscopy
T.T. Trinh (Institute of Ion Beam Physics and Materials Research, Technische Universität Dresden)
K. Asano (National Institute of Advanced Industrial Science and Technology (AIST), TU Delft - ChemE/Materials for Energy Conversion and Storage)
René Heller (Institute of Ion Beam Physics and Materials Research)
H. Reuther (Institute of Ion Beam Physics and Materials Research)
J. Grenzer (Institute of Ion Beam Physics and Materials Research)
H. Schreuders (TU Delft - ChemE/Afdelingsbureau)
B Dam (TU Delft - ChemE/Materials for Energy Conversion and Storage)
K. Potzger (Institute of Ion Beam Physics and Materials Research)
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Abstract
Sputter deposited Mg2FexSi1-x films of 250 nm thickness have been investigated by means of Mössbauer spectroscopy. While non-hydrogenated films are characterized by a quadrupole split doublet, hydrogenated regions show a singlet with reduced isomer shift. The relative areas of the spectra reflect the relation between loaded and unloaded regions prepared at the same loading conditions.
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