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Hydrogen storage in Mg2FeSi alloy thin films depending on the Fe-to-Si ratio measured by conversion electron Mössbauer spectroscopy

Journal Article (2018)
Author(s)

T. T. Trinh (Institute of Ion Beam Physics and Materials Research, Technische Universität Dresden)

K. Asano (National Institute of Advanced Industrial Science and Technology (AIST), TU Delft - Applied Sciences)

R. Heller (Institute of Ion Beam Physics and Materials Research)

H. Reuther (Institute of Ion Beam Physics and Materials Research)

J. Grenzer (Institute of Ion Beam Physics and Materials Research)

H. Schreuders (TU Delft - Applied Sciences)

B. Dam (TU Delft - Applied Sciences)

K. Potzger (Institute of Ion Beam Physics and Materials Research)

Research Group
ChemE/Materials for Energy Conversion and Storage
DOI related publication
https://doi.org/10.1016/j.nimb.2018.08.033 Final published version
More Info
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Publication Year
2018
Language
English
Research Group
ChemE/Materials for Energy Conversion and Storage
Volume number
434
Pages (from-to)
109-112
Downloads counter
204

Abstract

Sputter deposited Mg2FexSi1-x films of 250 nm thickness have been investigated by means of Mössbauer spectroscopy. While non-hydrogenated films are characterized by a quadrupole split doublet, hydrogenated regions show a singlet with reduced isomer shift. The relative areas of the spectra reflect the relation between loaded and unloaded regions prepared at the same loading conditions.