Column-parallel digital correlated multiple sampling for low-noise CMOS image sensors
Journal Article
(2012)
Author(s)
Y. Chen (TU Delft - Electronic Instrumentation)
Y. Xu (TU Delft - Electronic Instrumentation)
AJ Mierop (External organisation)
Albert Theuwissen (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.1109/JSEN.2011.2160391
To reference this document use:
https://resolver.tudelft.nl/uuid:8332bc56-c337-497c-accd-8e75a377e243
More Info
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Publication Year
2012
Language
English
Research Group
Electronic Instrumentation
Issue number
4
Volume number
12
Pages (from-to)
793-799
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