Defect Density Analysis of WOx and MoOx Thin Films Grown by Pulsed Laser Deposition for Heterojunction Solar Cell Applications

Journal Article (2025)
Author(s)

Daniele Scirè (Università degli Studi di Palermo)

Roberto Macaluso (Università degli Studi di Palermo)

Mauro Mosca (Università degli Studi di Palermo)

Maria Pia Casaletto (Instituto per lo Studio dei Materiali Nanostrutturati, Consiglio Nazionale delle Ricerche)

Olindo Isabella (TU Delft - Photovoltaic Materials and Devices)

Miro Zeman (TU Delft - Photovoltaic Materials and Devices)

Isodiana Crupi (Università degli Studi di Palermo)

Research Group
Photovoltaic Materials and Devices
DOI related publication
https://doi.org/10.1021/acsaem.5c00629
More Info
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Publication Year
2025
Language
English
Research Group
Photovoltaic Materials and Devices
Issue number
13
Volume number
8
Pages (from-to)
9016-9028
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Abstract

This study presents a comprehensive analysis of the optical and electronic properties of thin films of molybdenum oxide and tungsten oxide to implement hole-selective contact for heterojunction solar cells. These contacts are currently viewed as an alternative for the fabrication of doping-free solar cells. However, the spreading of this technology is still limited due to the development of S-shaped J-V curves, which affect the electrical performance of the cells, and further optimization in the material deposition process is therefore crucial to overcome these challenges. To improve transition metal oxide-based heterojunction technology, this work investigates the impact of oxygen vacancies on electrical performance, particularly their role in S-shaped J-V curves. Defect density evaluation through nondestructive techniques like photothermal deflection spectroscopy together with a detailed experimental characterization is presented in this paper to highlight the structural and optical properties of the films. Prototypes of solar cells incorporating hole-selective contacts with tungsten and molybdenum oxide are prepared to show S-shaped J-V characteristics under AM 1.5 illumination. An equivalent circuit modeling was used for understanding the electrical characteristics of the prototypes. Furthermore, this approach offers insights into the optimization of the performances of devices.