Stress relaxation and creep in free-standing thin aluminium films studied using a bulge tester.

Conference Paper (1999)
Author(s)

AJ Kalkman (TU Delft - QN/Fysics of NanoElectronics)

A.H. Verbruggen (TU Delft - QN/Fysics of NanoElectronics)

GCAM Janssen (TU Delft - OLD Metals Processing, Microstructures and Properties)

Research Group
QN/Fysics of NanoElectronics
More Info
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Publication Year
1999
Research Group
QN/Fysics of NanoElectronics
Pages (from-to)
265-270

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