Stress relaxation and creep in free-standing thin aluminium films studied using a bulge tester.
Conference Paper
(1999)
Author(s)
AJ Kalkman (TU Delft - QN/Fysics of NanoElectronics)
A.H. Verbruggen (TU Delft - QN/Fysics of NanoElectronics)
GCAM Janssen (TU Delft - OLD Metals Processing, Microstructures and Properties)
Research Group
QN/Fysics of NanoElectronics
To reference this document use:
https://resolver.tudelft.nl/uuid:874ef39b-586d-4ec8-9fa5-a2578478b69a
More Info
expand_more
expand_more
Publication Year
1999
Research Group
QN/Fysics of NanoElectronics
Pages (from-to)
265-270
No files available
Metadata only record. There are no files for this record.