Sensitive measurement method for evaluation of high thermal resistance in bipolar transistors
Conference Paper
(2002)
Author(s)
N Nenadovic (TU Delft - Electronic Components, Technology and Materials)
L.K. Nanver (TU Delft - Electronic Components, Technology and Materials)
H. Schellevis (TU Delft - Electronic Components, Technology and Materials)
D de Mooij (External organisation)
V Zieren (External organisation)
JW Slotboom (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:89680157-fa2a-444d-8289-bcbce021bd4b
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Publication Year
2002
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
77-82
ISBN (print)
0-7803-7464-9
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