A 280 μW Dynamic Zoom ADC With 120 dB DR 118 dB SNDR in 1 kHz BW

Journal article (2018)

Authors

S. Karmakar Electronic Instrumentation - EEMCS
B. Gonen Electronic Instrumentation - EEMCS
F. Sebastiano (OLD)Applied Quantum Architectures
Robert van Veldhoven NXP Semiconductors
K.A.A. Makinwa Microelectronics
Research Group
Electronic Instrumentation (EEMCS) (TU Delft)
Copyright: © 2018 S. Karmakar, B. Gonen, F. Sebastiano, Robert van Veldhoven, K.A.A. Makinwa
DOI: https://doi.org/10.1109/JSSC.2018.2865466
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Published Date

2018

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Instrumentation

Abstract

This paper presents a dynamic zoom analog-to-digital converter for use in low-bandwidth (<1 kHz) instrumentation applications. It employs a high-speed asynchronous successive approximation register (SAR) ADC that dynamically updates the references of a fully differential Δ Σ ADC. Compared to previous zoom ADCs, faster reference updates relax the loop filter requirements, thus allowing the adoption of energy-efficient amplifiers. Fabricated in a 0.16-μm CMOS process, the prototype occupies 0.26 mm² and achieves 119.1-dB peak signal-to-noise ratio (SNR), 118.1-dB peak signal-to-noise-and-distortion-ratio (SNDR), and 120.3-dB dynamic range (DR) in a 1-kHz bandwidth while consuming 280 μW. This results in a Schreier figure of merit (FoM) of 185.8 dB.

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