A 280 μW Dynamic Zoom ADC With 120 dB DR 118 dB SNDR in 1 kHz BW

Journal Article (2018)
Author(s)

S. Karmakar (TU Delft - Electronic Instrumentation)

Burak Gonen (TU Delft - Electronic Instrumentation)

Fabio Sebastiano (TU Delft - (OLD)Applied Quantum Architectures)

Robert Van Veldhoven (NXP Semiconductors)

Kofi A.A. Makinwa (TU Delft - Microelectronics)

Research Group
Electronic Instrumentation
Copyright
© 2018 S. Karmakar, B. Gonen, F. Sebastiano, Robert van Veldhoven, K.A.A. Makinwa
DOI related publication
https://doi.org/10.1109/JSSC.2018.2865466
More Info
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Publication Year
2018
Language
English
Copyright
© 2018 S. Karmakar, B. Gonen, F. Sebastiano, Robert van Veldhoven, K.A.A. Makinwa
Research Group
Electronic Instrumentation
Pages (from-to)
1-11
Reuse Rights

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Abstract

This paper presents a dynamic zoom analog-to-digital converter for use in low-bandwidth (<1 kHz) instrumentation applications. It employs a high-speed asynchronous successive approximation register (SAR) ADC that dynamically updates the references of a fully differential Δ Σ ADC. Compared to previous zoom ADCs, faster reference updates relax the loop filter requirements, thus allowing the adoption of energy-efficient amplifiers. Fabricated in a 0.16-μm CMOS process, the prototype occupies 0.26 mm² and achieves 119.1-dB peak signal-to-noise ratio (SNR), 118.1-dB peak signal-to-noise-and-distortion-ratio (SNDR), and 120.3-dB dynamic range (DR) in a 1-kHz bandwidth while consuming 280 μW. This results in a Schreier figure of merit (FoM) of 185.8 dB.

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