Defect States in Excimer-Laser Crystallized Single-Grain TFTs Studied with Isothermal Charge Deep-level Transient Spectroscopy
Conference Paper
(2007)
Author(s)
V Nadazdy (TU Delft - Electronic Components, Technology and Materials)
V Rana (TU Delft - Electronic Components, Technology and Materials)
R. Ishihara (TU Delft - Electronic Components, Technology and Materials)
S Lanyi (External organisation)
R Durny (External organisation)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
CIM Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:8c30ca92-483c-40e5-af60-0829ec8bbf06
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Publication Year
2007
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-4
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