Accelerated lifetime test for isolated components in linear drivers of high-voltage LED system
Conference Paper
(2013)
Author(s)
Bo Sun (TU Delft - Electronic Components, Technology and Materials)
Sau Wee Koh (TU Delft - Electronic Components, Technology and Materials)
CA Yuan (TU Delft - Electronic Components, Technology and Materials)
X Fan (External organisation)
Guo-Qi Zhang (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/EuroSimE.2013.6529911
To reference this document use:
https://resolver.tudelft.nl/uuid:903309b4-e651-4e4b-91ea-2f9dd3404caf
More Info
expand_more
expand_more
Publication Year
2013
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-5
ISBN (print)
978-1-4673-6138-5
No files available
Metadata only record. There are no files for this record.