Surface contamination induced resonance frequency shift of cantilevers
Conference Paper
(2009)
Authors
H Sadeghian (External organisation)
C. Yang (TU Delft - Electronic Instrumentation)
K Babaei Gavan (QN/Mol. Electronics & Devices)
J.F.L. Goosen (TU Delft - Electronic Instrumentation)
E.W.J.M. van der Drift (TU Delft - QN/Kavli Nanolab Delft)
Herre Van Der van der Zant (QN/Mol. Electronics & Devices)
P. J. French (TU Delft - Electronic Instrumentation)
Andre Bossche (TU Delft - Electronic Instrumentation)
F. van Van Keulen (TU Delft - Computational Design and Mechanics)
Research Group
Electronic Instrumentation
To reference this document use:
https://doi.org/http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068604
TU Delft Repository resolver:
https://resolver.tudelft.nl/93d9c36f-d28b-4396-a8a7-95df30dbfa7f
More Info
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Publication Year
2009
Research Group
Electronic Instrumentation
Pages (from-to)
396-399
ISBN (print)
978-1-4244-4629-2
DOI:
https://doi.org/http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068604
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