Surface contamination induced resonance frequency shift of cantilevers

Conference Paper (2009)
Authors

H Sadeghian (External organisation)

C. Yang (TU Delft - Electronic Instrumentation)

K Babaei Gavan (QN/Mol. Electronics & Devices)

J.F.L. Goosen (TU Delft - Electronic Instrumentation)

E.W.J.M. van der Drift (TU Delft - QN/Kavli Nanolab Delft)

Herre Van Der van der Zant (QN/Mol. Electronics & Devices)

P. J. French (TU Delft - Electronic Instrumentation)

Andre Bossche (TU Delft - Electronic Instrumentation)

F. van Van Keulen (TU Delft - Computational Design and Mechanics)

Research Group
Electronic Instrumentation
More Info
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Publication Year
2009
Research Group
Electronic Instrumentation
Pages (from-to)
396-399
ISBN (print)
978-1-4244-4629-2
DOI:
https://doi.org/http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068604

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