A 21-bit Read-Out IC Employing Dynamic Element Matching with 0.037% Gain Error
Conference Paper
(2011)
Author(s)
R Wu (TU Delft - Electronic Instrumentation)
Johan H Huijsing (TU Delft - Electronic Instrumentation)
Kofi A.A. Kofi (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.1109/A-SSCC.2011.6123647
To reference this document use:
https://resolver.tudelft.nl/uuid:9e3a6337-e3f3-49ef-96ea-f41f8b82bcc2
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Publication Year
2011
Language
English
Research Group
Electronic Instrumentation
Pages (from-to)
241-244
ISBN (print)
978-1-4577-1785-7
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