Ultra-high depth resolution analysis with a magnetic-sector SIMS
Journal Article
(1998)
Author(s)
ZX Jiang (External organisation)
PFA Alkemade (TU Delft - Old - sect Electronic Materials (NS/EM))
Research Group
Old - sect Electronic Materials (NS/EM)
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https://resolver.tudelft.nl/uuid:a11b9004-4d63-46f1-a46c-9a96fabccb86
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Publication Year
1998
Research Group
Old - sect Electronic Materials (NS/EM)
Volume number
18
Pages (from-to)
288-293
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