Library
search
local_library
Repository
ZJ
ZX Jiang
View Pure Profile
Authored
18 records found
Anomalous surface transient of boron in Si.
Conference paper -
P.F.A. Alkemade
,
ZX Jiang
Approach to the characterization of through-oxide boron implantation by secondary ion mass spectrometry.
Journal article -
ZX Jiang
,
S Backer
,
JJ Lee
,
LY Wu
,
T Guenther
,
D Sieloff
,
P Choi
,
M Foisy
,
P.F.A. Alkemade
Complex roughening of Si under oblique bombardment by low-energy oxygen ions.
Journal article -
P.F.A. Alkemade
,
ZX Jiang
Apparent depths of B and Ge deltas in Si as measured by secondary ion mass spectrometry.
Journal article -
ZX Jiang
,
P.F.A. Alkemade
,
CH Tung
,
JLF Wang
Ultra-high depth resolution analysis with a magnetic-sector SIMS
Journal article -
ZX Jiang
,
P.F.A. Alkemade
The complex formation of ripples during depth profiling of Si with low energy, grazing oxygen beams
Journal article -
ZX Jiang
,
P.F.A. Alkemade
High depth resolution SIMS analysis with low-energy grazing O2+ beams
Journal article -
ZX Jiang
,
E Algra
,
P.F.A. Alkemade
,
S Radelaar
Ultra-high depth resolution with a grazing sub-keV oxygen beam in a magnetic sector SIMS
Journal article -
P.F.A. Alkemade
,
ZX Jiang
,
CCG Visser
,
S Radelaar
,
WM Arnoldbik
SIMS Meting aan SiGe (B) multilaag
Report -
ZX Jiang
,
P.F.A. Alkemade
Depth profile analysis of Si with low-energy and oblique O2+ beams.
Conference paper -
ZX Jiang
,
P.F.A. Alkemade
,
JLF Wang
Ultra-high depth resolution RBS and SIMS of the modification of a Ge delta in Si during 2 keV O2+ sputtering
Journal article -
WM Arnoldbik
,
ZX Jiang
,
P.F.A. Alkemade
,
DJ Boerma
Erosion rate change and surface roughening in Si during oblique O2+ bombardment with oxygen flooding
Conference paper -
ZX Jiang
,
P.F.A. Alkemade
Secondary ion mass spectrometry and atomic force spectroscopy studies of surface roughening, erosion rate change and depth resolurion in Si during 1 keV 60 degrees O2+ bombardment with oxygen flooding
Journal article -
ZX Jiang
,
P.F.A. Alkemade
A noval approach for the determination of the actual incidence angle in a magnetic-sector SIMS instrument
Journal article -
ZX Jiang
,
P.F.A. Alkemade
The surface transient in Si for SIMS with oblique low-energy o2+ beams.
Journal article -
ZX Jiang
,
P.F.A. Alkemade
Ionization probability of secondary Cs under Cs+ bombardment
Conference paper -
ZX Jiang
,
LZ Cha
,
YX Wang
,
HC Chen
,
X Cheng
Depth resolution for Ge in Si with low energy and grazing O2+ beams
Conference paper -
P.F.A. Alkemade
,
ZX Jiang
,
R Badheka
,
JA van den Berg
,
DG Armour
Ultra-high depth resolution SIMS with sub-kev grazing O2+ beams
Conference paper -
P.F.A. Alkemade
,
ZX Jiang
,
CCG Visser
,
S Radelaar
,
WM Arnoldbik