Depth resolution for Ge in Si with low energy and grazing O2+ beams

Conference paper (1998)

Authors

P.F.A. Alkemade Old - sect Electronic Materials (NS/EM)
ZX Jiang External organisation
R Badheka External organisation
JA van den Berg External organisation
DG Armour External organisation
Research Group
Old - sect Electronic Materials (NS/EM)
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Published Date

1998

Language

Undefined/Unknown

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Research Group

Old - sect Electronic Materials (NS/EM)