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JLF Wang
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2 records found
Apparent depths of B and Ge deltas in Si as measured by secondary ion mass spectrometry.
Journal article -
ZX Jiang
,
P.F.A. Alkemade
,
CH Tung
,
JLF Wang
Depth profile analysis of Si with low-energy and oblique O2+ beams.
Conference paper -
ZX Jiang
,
P.F.A. Alkemade
,
JLF Wang