An experimental analysis of spot defects in SRAMs: realistic fault models and test
Conference Paper
(2000)
Author(s)
Said Hamdioui (TU Delft - Computer Engineering)
AJ van de Goor Ph D (External organisation)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:a64f951b-ee86-4344-b887-fbda43e3c686
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Publication Year
2000
Research Group
Computer Engineering
Pages (from-to)
131-138
ISBN (print)
0-7695-0887-1
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