JFET test structures for monitoring strain-enhanced mobility
Conference Paper
(2006)
Author(s)
L. Shi (TU Delft - Electronic Components, Technology and Materials)
G. Lorito (TU Delft - Old - EWI Sect. ECTM)
V. Jovanovic (TU Delft - Old - EWI Sect. ECTM)
S Fregonese (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
L. K. Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:a6606202-0841-4688-a9d5-7f58e4a9b980
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Publication Year
2006
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
432-435
ISBN (print)
90-73461-44-8
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