JFET test structures for monitoring strain-enhanced mobility

Conference paper (2006)

Authors

L. Shi Electronic Components, Technology and Materials - EEMCS
G. Lorito Old - EWI Sect. ECTM
V. Jovanovic Old - EWI Sect. ECTM
S Fregonese Old - EWI Ch. Integrated Sensing Devices
L.K. Nanver Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2006

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials