On the use of high precision electrical resistance measurement for analyzing the damage development during accelerated test of Pb-free solder interconnects

Conference paper (2013)

Authors

J. Zhang Electronic Components, Technology and Materials - EEMCS
S. van der Zwaag Novel Aerospace Materials - Aerospace Engineering
H.W. van Zeijl Electronic Components, Technology and Materials - EEMCS
Kouchi Zhang Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2013

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials