Assessment of RDL Technology at Sub-THz Frequencies

Conference Paper (2025)
Author(s)

C. Tadolini (TU Delft - Tera-Hertz Sensing)

T. Verduci (TNO, Chip Integration Technology Center)

E. Sopubekova (Chip Integration Technology Center, TNO)

F. Chiappini (Chip Integration Technology Center, TNO)

S. Monni (TNO)

P.M. Sberna (TU Delft - Tera-Hertz Sensing)

M. Spirito (TU Delft - Electronics)

N. Llombart (TU Delft - Tera-Hertz Sensing)

M. Alonso Del Pino (TU Delft - Tera-Hertz Sensing)

Research Group
Tera-Hertz Sensing
DOI related publication
https://doi.org/10.1109/IRMMW-THz61557.2025.11319766
More Info
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Publication Year
2025
Language
English
Research Group
Tera-Hertz Sensing
Publisher
IEEE
ISBN (print)
979-8-3503-7884-9
ISBN (electronic)
979-8-3503-7883-2
Reuse Rights

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Abstract

This contribution presents the assessment of RDL technology at sub-terahertz frequencies based on polybenzoxazole (PBO) polymers. A stack of two PBO layers of 10 thickness with 3 metallization of 5 copper is being under development. Vias as small as 10 and a separation of 60 are being explored. To assess the materials and capabilities of this technology, GCPW, stripline transmission line structures are being assessed, expecting losses in the order of 1.3dB/mm and 2.1dB/mm respectively. Moreover, two resonators have been designed to enhance the accuracy of the characterization.

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