Testing address decoder faults in two-port memories: fault models, test, consequences of port restrictions, and test strategy
Journal Article
(2000)
Author(s)
Said Hamdioui (TU Delft - Computer Engineering)
AJ van de Goor Ph D (External organisation)
Research Group
Computer Engineering
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https://resolver.tudelft.nl/uuid:b54e6c8f-6c2f-4bc5-b9fe-02abb883b194
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Publication Year
2000
Research Group
Computer Engineering
Issue number
5
Volume number
16
Pages (from-to)
487-498
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