Application of the Dual Beam FIB for crystallographic infection
Poster
(2003)
Author(s)
VGM Sivel (TU Delft - OLD Virtual Materials and Mechanics)
Paul Alkemade (TU Delft - Old - sect Electronic Materials (NS/EM))
Henny W. Zandbergen (TU Delft - QN/High Resolution Electron Microscopy)
Research Group
OLD Virtual Materials and Mechanics
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Publication Year
2003
Research Group
OLD Virtual Materials and Mechanics
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