A Compact Sensor Readout Circuit with Combined Temperature, Capacitance and Voltage Sensing Functionality

Conference Paper (2017)
Author(s)

Bahman Yousefzadeh (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Wei Wu (Student TU Delft)

Berry Buter (NXP Semiconductors)

Kofi Makinwa (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Michiel Pertijs (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.23919/VLSIC.2017.8008555 Final published version
More Info
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Publication Year
2017
Language
English
Research Group
Electronic Instrumentation
Bibliographical Note
C7-1
Pages (from-to)
C78-C79
ISBN (print)
978-4-86348-606-5
ISBN (electronic)
978-4-86348-614-0
Event
2017 Symposium on VLSI Technology and Circuits (2017-06-05 - 2017-06-08), Kyoto, Japan
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Abstract

This paper presents an area- and energy-efficient sensor readout circuit, which can precisely digitize temperature, capacitance and voltage. The three modes use only on-chip references and employ a shared zoom ADC based on SAR and ΔΣ conversion to save die area. Measurements on 24 samples from a single wafer show a temperature inaccuracy of ±0.2 °C (3σ) over the military temperature range (-55°C to 125°C). The voltage sensing shows an inaccuracy of ±0.5%. The sensor also offers 18.7-ENOB capacitance-to-digital conversion, which handles up to 3.8 pF capacitance with a 0.76 pJ/conv.-step energy-efficiency FoM. It occupies 0.33 mm in a 0.16 μm CMOS process and draws 4.6 μA current from a 1.8 V supply.