A 0.01 mm210MHz RC Frequency Reference with a 1-Point On-Chip-Trimmed Inaccuracy of ±0.28% from -45°C to 125°C in 0.18μm CMOS

Conference Paper (2023)
Author(s)

Xiaomeng An (Student TU Delft)

Sining Pan (TU Delft - Electrical Engineering, Mathematics and Computer Science, Tsinghua University)

Hui Jiang (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Kofi A.A. Makinwa (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Department
Microelectronics
DOI related publication
https://doi.org/10.1109/ISSCC42615.2023.10067530 Final published version
More Info
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Publication Year
2023
Language
English
Department
Microelectronics
Bibliographical Note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Pages (from-to)
60-62
Publisher
IEEE
ISBN (electronic)
9781665428002
Event
2023 IEEE International Solid-State Circuits Conference, ISSCC 2023 (2023-02-19 - 2023-02-23), Virtual, Online, United States
Page Views
285
Collections
Institutional Repository
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Abstract

CMOS frequency references based on RC oscillators are usually preferred over bulky crystals in loT applications [1-5]. However, due to the process spread and finite temperature coefficient (TC) of most on-chip resistors, RC oscillators require trimming and temperature compensation to achieve decent accuracy. Enabled by high-resolution trimming techniques such as DeltaSigma [1], [2] or pulse-density [3] modulation, recent designs can obtain good accuracy (<0.1 %) at the expense of large chip area. However, existing compact (<0.02mm2) designs suffer from frequency errors in the order of 1% or more [4], [5]. Moreover, their temperature compensation schemes usually require the use of resistors with complementary TCs, which are not available in all CMOS technologies.

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