A 210nW BJT-based Temperature Sensor with an Inaccuracy of ±0.15°C (3s) from -15°C to 85°C

Conference Paper (2022)
Author(s)

T. Someya (TU Delft - Electronic Instrumentation)

Vincent Van Hoek (Student TU Delft)

J. Angevare (TU Delft - Electronic Instrumentation)

S. Pan (TU Delft - Electronic Instrumentation)

K.A.A. Makinwa (TU Delft - Microelectronics)

Research Group
Electronic Instrumentation
Copyright
© 2022 T. Someya, Vincent Van Hoek, J. Angevare, S. Pan, K.A.A. Makinwa
DOI related publication
https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830266
More Info
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Publication Year
2022
Language
English
Copyright
© 2022 T. Someya, Vincent Van Hoek, J. Angevare, S. Pan, K.A.A. Makinwa
Research Group
Electronic Instrumentation
Pages (from-to)
120-121
ISBN (electronic)
978-1-6654-9772-5
Reuse Rights

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Abstract

This paper presents a 210nW BJT-based temperature sensor that achieves an inaccuracy of ±0.15°C (3s) from -15°C to 85°C. A dual-mode front-end (FE), which combines a bias circuit and a BJT core, halves the power needed to generate well-defined CTAT (VBE) and PTAT (?VBE) voltages. The use of a tracking ?S ADC reduces FE signal swing and further reduces system power consumption. In a 180-nm BCD process, the prototype achieves a 15mK resolution in 50ms conversion time, translating into a state-of-the-art FoM of 2.3pJK2.

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