Degradation of light emitting diodes

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Degradation of light emitting diodes

A proposed methodology

Journal Article (2011)

Author(s)

Sau Koh (Material Innovation Institute (M2i), TU Delft - Electrical Engineering, Mathematics and Computer Science)

Willem Van Driel (Philips Lighting Research, TU Delft - Electrical Engineering, Mathematics and Computer Science)

Guo Qi Zhang (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Research Group

Electronic Components, Technology and Materials

LED Light Temperature Degradation Lumen Overstress current

DOI related publication

https://doi.org/10.1088/1674-4926/32/1/014004 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:c6b477fd-8537-4915-bc20-735c1e27487d

More Info

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Publication Year

2011

Language

English

Research Group

Electronic Components, Technology and Materials

Volume number

32

Article number

014004

Downloads counter

99

Abstract

Due to their long lifetime and high efficacy, light emitting diodes have the potential to revolutionize the illumination industry. However, self heat and high environmental temperature which will lead to increased junction temperature and degradation due to electrical overstress can shorten the life of the light emitting diode. In this research, a methodology to investigate the degradation of the LED emitter has been proposed. The epoxy lens of the emitter can be modelled using simplified Eyring methods whereas an equation has been proposed for describing the degradation of the LED emitters.