In situ transmission electron microscopy imaging of grain growth in a platinum nanobridge induced by electric current annealing

Journal Article (2011)
Author(s)

B Gao (TU Delft - QN/Mol. Electronics & Devices)

M Rudneva (QN/High Resolution Electron Microscopy)

Kimberly S. McGarrity (TU Delft - Statistics)

Q Xu (QN/High Resolution Electron Microscopy)

F. Prins (TU Delft - QN/Mol. Electronics & Devices, TU Delft - QN/Fysics of NanoElectronics)

Jos M. Thijssen (TU Delft - QN/Theoretical Physics)

H.W. Zandbergen (QN/High Resolution Electron Microscopy)

H. S J van der Zant (TU Delft - QN/Mol. Electronics & Devices)

Research Group
QN/Mol. Electronics & Devices
DOI related publication
https://doi.org/10.1088/0957-4484/22/20/205705
More Info
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Publication Year
2011
Research Group
QN/Mol. Electronics & Devices
Issue number
20
Volume number
22
Pages (from-to)
205705-205711

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