X-ray diffraction study of the composition and strain fields in buried SiGe islands
Journal Article
(2009)
Authors
N Hrauda (External organisation)
JJ Zhang (External organisation)
M Stoffel (External organisation)
J Stangl (External organisation)
G. Bauer (External organisation)
A Rehman-Khan (External organisation)
V Holy (External organisation)
OG Schmist (External organisation)
V. Jovanovic (TU Delft - Electronic Components, Technology and Materials)
LK Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/cdd92f21-3424-4bd0-8c07-6afb49fdb94c
More Info
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Publication Year
2009
Research Group
Electronic Components, Technology and Materials
Volume number
167
Pages (from-to)
41-46
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