X-ray diffraction study of the composition and strain fields in buried SiGe islands
N Hrauda (External organisation)
JJ Zhang (External organisation)
M Stoffel (External organisation)
J Stangl (External organisation)
G Bauer (External organisation)
A Rehman-Khan (External organisation)
V Holy (External organisation)
OG Schmist (External organisation)
V Jovanovic (TU Delft - Electronic Components, Technology and Materials)
L. K. Nanver (TU Delft - Electronic Components, Technology and Materials)
More Info
expand_more
No files available
Metadata only record. There are no files for this record.