X-ray diffraction study of the composition and strain fields in buried SiGe islands

Journal Article (2009)
Authors

N Hrauda (External organisation)

JJ Zhang (External organisation)

M Stoffel (External organisation)

J Stangl (External organisation)

G. Bauer (External organisation)

A Rehman-Khan (External organisation)

V Holy (External organisation)

OG Schmist (External organisation)

V. Jovanovic (TU Delft - Electronic Components, Technology and Materials)

LK Nanver (TU Delft - Electronic Components, Technology and Materials)

Research Group
Electronic Components, Technology and Materials
More Info
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Publication Year
2009
Research Group
Electronic Components, Technology and Materials
Volume number
167
Pages (from-to)
41-46

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