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JZ
JJ Zhang
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Authored
3 records found
X-ray diffraction study of the composition and strain fields in buried SiGe islands
Journal article -
N Hrauda
,
JJ Zhang
,
M Stoffel
,
J Stangl
,
G Bauer
,
A Rehman-Khan
,
V Holy
,
OG Schmist
,
V. Jovanovic
,
L.K. Nanver
X-ray investigation of buried SiGe islands for devices with strain-enhanced mobility
Journal article -
N Hrauda
,
JJ Zhang
,
J Stangl
,
A Rehman-Khan
,
G Bauer
,
M Stoffel
,
OG Schmist
,
V. Jovanovic
,
L.K. Nanver
Integration of MOSFETs with SiGe dots as stressor material
Journal article -
L.K. Nanver
,
V. Jovanovic
,
L Miglio
,
H Kosina
,
A Marzegalli
,
G Vastola
,
G Mussler
,
J Stangl
,
G Bauer
,
J. van der Cingel
,
E Bonera
,
C Biasotto
,
J Moers
,
D Gruetzmacher
,
JJ Zhang
,
N Hrauda
,
M Stoffel
,
F Pezzoli
,
OG Schmidt