On Defect Oriented Testing for Hybrid CMOS/memristor Memory

Conference paper (2011)

Authors

N.Z.B. Haron Computer Engineering - EEMCS
S. Hamdioui Computer Engineering - EEMCS
Research Group
Computer Engineering (EEMCS) (TU Delft)
More Info
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Published Date

2011

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering