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NH
N.Z.B. Haron
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Authored
19 records found
On Correcting Cluster Errors in Nanoelectronic Memories
Conference paper -
N.Z.B. Haron
,
S. Hamdioui
Fault tolerance architecture for reliable hybrid CMOS/nanodevices memory
Poster -
N.Z.B. Haron
,
S. Hamdioui
Redundant residue number system code for fault-tolerant hybrid memories
Journal article -
N.Z.B. Haron
,
S. Hamdioui
ECC design for fault-tolerant crossbar memories: a case study
Conference paper -
N.Z.B. Haron
,
S. Hamdioui
,
Z Ahyadi
Residue-based code for reliable hybrid memories
Conference paper -
N.Z.B. Haron
,
S. Hamdioui
Redundant Residue Number System Code for Fault-Tolerant Hybrid Memories
Journal article -
N.Z.B. Haron
,
S. Hamdioui
Emerging crossbar-based hybrid nanoarchitectures for future computing systems
Conference paper -
N.Z.B. Haron
,
S. Hamdioui
Using RRNS codes for cluster faults tolerance in hybrid memories
Conference paper -
N.Z.B. Haron
,
S. Hamdioui
Mitigating defective CMOS to non-CMOS vias in CMOS/molecular memories
Conference paper -
N.Z.B. Haron
,
S. Hamdioui
Why is CMOS scaling coming to an END?
Conference paper -
N.Z.B. Haron
,
S. Hamdioui
CMOS scaling impacts on reliability, what do we understand?
Conference paper -
M.S.K. Seyab
,
N.Z.B. Haron
,
S. Hamdioui
High-performance cluster-fault tolerance scheme for hybrid nanoelectronic memories
Conference paper -
N.Z.B. Haron
,
S. Hamdioui
Emerging non-CMOS nanoelectronic devices-What are they?
Conference paper -
N.Z.B. Haron
,
S. Hamdioui
,
S.D. Cotofana
Cost-Efficient Fault-Tolerant Decoder for Hybrid Nanoelectronic Memories
Conference paper -
N.Z.B. Haron
,
S. Hamdioui
DfT schemes for resistive open defects in RRAMs
Conference paper -
N.Z.B. Haron
,
S. Hamdioui
Testability and fault tolerance for emerging nanoelectronic memories
Doctoral thesis -
N.Z.B. Haron
NBTI Monitoring and Design for Reliability in Nanoscale Circuits
Conference paper -
M.S.K. Seyab
,
N.Z.B. Haron
,
S. Hamdioui
,
Francky Catthoor
Testing open defects in memristor-based memories
Journal article -
S. Hamdioui
,
M. Taouil
,
N.Z.B. Haron
On Defect Oriented Testing for Hybrid CMOS/memristor Memory
Conference paper -
N.Z.B. Haron
,
S. Hamdioui