Testing open defects in memristor-based memories

Journal article (2016)

Authors

S. Hamdioui Computer Engineering - EEMCS
M. Taouil Computer Engineering - EEMCS
N.Z.B. Haron Computer Engineering - EEMCS
Research Group
Computer Engineering (EEMCS) (TU Delft)
More Info
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Published Date

2016

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering