CMOS scaling impacts on reliability, what do we understand?
Conference Paper
(2008)
Author(s)
MSK Seyab (TU Delft - Old - EWI Sect. Computer Engineering)
N.Z.B. Haron (TU Delft - Old - EWI Sect. Computer Engineering)
S Hamdioui (TU Delft - Computer Engineering)
Research Group
Old - EWI Sect. Computer Engineering
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https://resolver.tudelft.nl/uuid:27f0a14e-80e8-41bb-b5bb-38d990c42d2b
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Publication Year
2008
Research Group
Old - EWI Sect. Computer Engineering
Pages (from-to)
260-266
ISBN (print)
978-90-73461-56-7
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