Column-Parallel Circuits with Digital Correlated Multiple Sampling for Low Noise CMOS Imagers
Conference Paper
(2011)
Author(s)
Y. Chen (TU Delft - Electronic Instrumentation)
Y Xu (TU Delft - Electronic Instrumentation)
A. Mierop (TU Delft - Electronic Instrumentation)
Albert Theuwissen (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
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https://resolver.tudelft.nl/uuid:d270770f-5e4c-4417-9c8d-6de2f81fff4e
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Publication Year
2011
Language
English
Research Group
Electronic Instrumentation
Pages (from-to)
78-81
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