A combined TEM and time-resolved optical reflectivity investigation into the excimer-laser crystallization of a-Si films
Journal Article
(2001)
Author(s)
FC Voogt (External organisation)
R Ishihara (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:d305c378-b250-4e11-84ab-24452a0a8235
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Publication Year
2001
Research Group
Electronic Components, Technology and Materials
Volume number
383
Pages (from-to)
45-47
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