A combined TEM and time-resolved optical reflectivity investigation into the excimer-laser crystallization of a-Si films

Journal article (2001)

Authors

FC Voogt External organisation
R. Ishihara Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2001

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials