Prediction of interfacial delamination in stacked IC structures using combined experimental and simulation methods

van Driel, WD; Liu, C; Zhang, GQ; Janssen, JHJ; van Silfhout, RBR; van Gils, MAJ; Ernst, L.J.

Prediction of interfacial delamination in stacked IC structures using combined experimental and simulation methods

Journal article (2004)

Authors

WD van Driel External organisation

C Liu Dynamics of Micro and Nano Systems

GQ Zhang External organisation

JHJ Janssen External organisation

RBR van Silfhout External organisation

MAJ van Gils External organisation

L.J. Ernst Dynamics of Micro and Nano Systems

Research Group

Dynamics of Micro and Nano Systems

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Published Date

2004

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Research Group

Dynamics of Micro and Nano Systems

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