Prediction of interfacial delamination in stacked IC structures using combined experimental and simulation methods
Journal Article
(2004)
Author(s)
WD van Driel (External organisation)
C Liu (TU Delft - Dynamics of Micro and Nano Systems)
GQ Zhang (External organisation)
JHJ Janssen (External organisation)
RBR van Silfhout (External organisation)
MAJ van Gils (External organisation)
L.J. Ernst (TU Delft - Dynamics of Micro and Nano Systems)
Research Group
Dynamics of Micro and Nano Systems
To reference this document use:
https://resolver.tudelft.nl/uuid:d483a8d9-11a3-431e-98d7-476e233b32eb
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Publication Year
2004
Research Group
Dynamics of Micro and Nano Systems
Volume number
44
Pages (from-to)
2019-2027
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