Simple method to evaluate minority carrier injection levels in schottky diodes
Conference Paper
(2011)
Author(s)
L Qi (TU Delft - Electronic Components, Technology and Materials)
G. Lorito (TU Delft - Electronic Components, Technology and Materials)
L. K. Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:dcdd0a11-1cfe-4c76-a5da-1b88263141b5
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Publication Year
2011
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-3
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