The effect of the detector resolution on the Doppler broadening measurements of both valence and core electron-positron annihilation
Journal Article
(1999)
Author(s)
VJ Ghosh (External organisation)
B Nielsen (External organisation)
AC Kruseman (External organisation)
PE Mijnarends (TU Delft - Old - Section Defects in Materials)
A van Veen (TU Delft - Old - Section Defects in Materials)
KG Lynn (External organisation)
Research Group
Old - Section Defects in Materials
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https://resolver.tudelft.nl/uuid:de0bac66-1d47-4f47-bb80-63c7fced6b55
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Publication Year
1999
Research Group
Old - Section Defects in Materials
Volume number
149
Pages (from-to)
234-237
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