The effect of the detector resolution on the Doppler broadening measurements of both valence and core electron-positron annihilation

Journal article (1999)

Authors

VJ Ghosh External organisation
B Nielsen External organisation
AC Kruseman External organisation
P.E. Mijnarends Old - Section Defects in Materials
A van Veen Old - Section Defects in Materials
KG Lynn External organisation
Research Group
Old - Section Defects in Materials
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Published Date

1999

Language

Undefined/Unknown

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Research Group

Old - Section Defects in Materials